By R. Curtis Bird and J. S. Williams (Eds.)
Using ion beams for fabrics research consists of many alternative ion-atom interplay techniques which formerly have mostly been thought of in separate experiences and texts. a listing of books and convention court cases is given in desk 2. This publication is split into 3 components, the 1st which treats all ion beam thoughts and their functions in such various fields as fabrics technology, skinny movie and semiconductor know-how, floor technology, geology, biology, drugs, environmental technological know-how, archaeology and so on. Read more...
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Extra info for Ion Beams for Materials Analysis
A h e a d - o n collision with t h e first a t o m in a r o w p r o d u c e s a collision sequence of recoiling target a t o m s along a low i n d e x (close-packed) crystal direction. 2. F o r high energy light ions, collision recoil sequences h a v e extremely low probabilities. c. Channeling and Blocking Crystals h a v e a degree of t r a n s p a r e n c y to ions i n c i d e n t along a low i n d e x direction a n d this leads to e n h a n c e d p e n e t r a t i o n w h i c h is t e r m e d channeling.
Iii. Sputtering a c c o m p a n i e s collision cascades w h i c h cause target a t o m s to be ejected (Fig. 12d). F o r e x a m p l e , b e t w e e n 1 a n d 10 a t o m s m a y b e ejected for each 10 keV A r ion i n c i d e n t o n a s a m p l e surface. T h e n u m b e r is t e r m e d the s p u t t e r coefficient (Ys) w h i c h is p r o p o r t i o n a l t o t h e energy deposited close to t h e surface in d i s p l a c e m e n t collisions a n d inversely p r o p o r t i o n a l to t h e surface b i n d i n g energy ( C h a p t e r 7).
1 Sensitivity and Detection Limits Cross-section values give s o m e i d e a of relative sensitivities w h i c h c a n b e expected in IBA (Fig. S. R. Bird unit ion dose a n d a t o m c o n c e n t r a t i o n ) are often m o r e useful. H o w e v e r , the experimentally o b s e r v e d yields d e p e n d o n angle of o b s e r v a t i o n , solid angle, filters a n d d e t e c t o r efficiency a n d o t h e r factors ( C h a p t e r 12). Since these are all specific t o a p a r t i c u l a r e x p e r i m e n t a l setup, so also are t h e sensitivity a n d d e t e c t i o n limits achieved.
Ion Beams for Materials Analysis by R. Curtis Bird and J. S. Williams (Eds.)