By Gray, Kirk; Paschkewitz, John James
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Additional info for Next generation HALT and HASS : robust design of electronics and systems
HALT is used to find stress limits and design weaknesses that could decrease field reliability, and is best performed during design and development phase. HASS is an ongoing application of combinations of stresses, defined from stress limits found empirically during HALT to detect any latent defects or reduction in the design’s strength introduced during mass manufacturing. Only after a system weakness is discovered can it be investigated and its significance and relevance to reliability be determined.
Basis and Limitations of Typical Current Reliability Methods 11 The cost of failures for a company introducing a new electronics product to market are much more significant at the front end of the bathtub curve, the ‘infant mortality’ period, rather than the ‘useful life’ or ‘wear‐out’ period in the bathtub curve. This includes the tangible and quantifiable cost of service and warranty replacements, and less tangible but real costs in lost sales due to perceptions of poor reliability in a competitive market.
The increase in densities of integration, reduction of feature sizes in integrated circuits and new packaging technologies introduces new fabrication and use physics that drive failure mechanisms and this is expected to continue for the foreseeable future. Other changes in electronics materials may be implemented from concerns of the impact of electronics on the earth’s environment. The change in going from using leaded solders to lead‐free solders, and 14 Next Generation HALT and HASS restricting the use of flame retardants are two examples of changes required by the directive on the restriction of the use of certain hazardous substances in electrical and electronic equipment.
Next generation HALT and HASS : robust design of electronics and systems by Gray, Kirk; Paschkewitz, John James